DISTORTION PROPERTIES OF GaN SWITCHES AT HIGH-TEMPERATURES

Author: Kameche Mohamed  

Publisher: Springer Publishing Company

ISSN: 0195-9271

Source: International Journal of Infrared and Millimeter Waves, Vol.27, Iss.8, 2006-08, pp. : 1133-1144

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Abstract

The origins of HEMT distortion in passive control applications as SPST switch are presented in this paper. Also, this paper describes the change of the AlGaN/GaN HEMT switch distortion properties (second-and third distortion intercept points) over a wide range of temperature. The results indicate that the change in second-and third-order distortion intercept points is smaller (about 2dBm) over a wide range of temperature from −50 to +300°C. A comparison of the GaN-based HEMT switch with InP-and GaAs-HEMT switches shows that the GaN technology generates lower distortion than its InP and GaAs technologies counterpart.