Author: Makino Toshiro Wakabayashi Hidenobu
Publisher: Springer Publishing Company
ISSN: 0195-928X
Source: International Journal of Thermophysics, Vol.31, Iss.11-12, 2010-12, pp. : 2283-2294
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Abstract
A new spectrophotometer system is developed for the study of thermal radiation characteristics of real surfaces in thermal engineering environments. The system measures spectra of normal incidence hemispherical reflectance
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