Progress in Noise Thermometry at 505 K and 693 K Using Quantized Voltage Noise Ratio Spectra

Author： Tew W.   Benz S.   Dresselhaus P.   Coakley K.   Rogalla H.   White D.   Labenski J.  

Publisher： Springer Publishing Company

ISSN： 0195-928X

Source： International Journal of Thermophysics, Vol.31, Iss.8-9, 2010-09, pp. : 1719-1738

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