Author: Pedersen H. B. Strasser D. Amarant B. Heber O. Rappaport M. L. Zajfman D.
Publisher: Springer Publishing Company
ISSN: 0304-3843
Source: Hyperfine Interactions, Vol.146, Iss.1-4, 2003-01, pp. : 231-235
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
An in-situ TEM study of the effects of 6 keV He ion irradiation on Si and SiO2
Journal of Physics: Conference Series , Vol. 371, Iss. 1, 2012-07 ,pp. :
Making channeling visible: keV noble gas ion trails on Pt(111)
New Journal of Physics, Vol. 13, Iss. 1, 2011-01 ,pp. :
Journal of Physics B: Atomic, Molecular and Optical Physics, Vol. 47, Iss. 22, 2014-11 ,pp. :