On label dependence and loss minimization in multi-label classification

Author: Dembczyński Krzysztof   Waegeman Willem   Cheng Weiwei   Hüllermeier Eyke  

Publisher: Springer Publishing Company

ISSN: 0885-6125

Source: Machine Learning, Vol.88, Iss.1-2, 2012-07, pp. : 5-45

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Abstract