Structural, optical and electrical studies on nanocrystalline tin oxide (SnO2) thin films by electron beam evaporation technique

Author: Senthilkumar V.   Vickraman P.  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.21, Iss.6, 2010-06, pp. : 578-583

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