Extending acoustic microscopy for comprehensive failure analysis applications

Author: Brand Sebastian   Czurratis Peter   Hoffrogge Peter   Temple Dorota   Malta Dean   Reed Jason   Petzold Matthias  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.22, Iss.10, 2011-10, pp. : 1580-1593

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Abstract