Author: Ho Li-Ngee Wu Teng Nishikawa Hiroshi Takemoto Tadashi Miyake Koichi Fujita Masakazu Ota Koyu
Publisher: Springer Publishing Company
ISSN: 0957-4522
Source: Journal of Materials Science: Materials in Electronics, Vol.22, Iss.7, 2011-07, pp. : 735-740
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