The change in the electrical transport mechanism from the grain boundary conduction to the nearest-neighbor hopping conduction in SnO2

Author: Yildiz A.   Alsaç A.   Serin T.   Serin N.  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.22, Iss.7, 2011-07, pp. : 872-875

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract