![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Iyevlev V. Kostyuchenko A. Sumets M. Vakhtel V.
Publisher: Springer Publishing Company
ISSN: 0957-4522
Source: Journal of Materials Science: Materials in Electronics, Vol.22, Iss.9, 2011-09, pp. : 1258-1263
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Vayunandana Reddy Y. Mergel D.
Journal of Materials Science: Materials in Electronics, Vol. 17, Iss. 12, 2006-12 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Structural Properties of Al2O3:C:Mg Thin Films by RF Magnetron Sputtering
Advanced Materials Research, Vol. 2015, Iss. 1107, 2015-07 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Shih Wen-Ching Chiang Ming-Han
Journal of Materials Science: Materials in Electronics, Vol. 21, Iss. 8, 2010-08 ,pp. :