Bayesian analysis of within-field variability of corn yield using a spatial hierarchical model

Author: Jiang Pingping   He Zhuoqiong   Kitchen Newell   Sudduth Kenneth  

Publisher: Springer Publishing Company

ISSN: 1385-2256

Source: Precision Agriculture, Vol.10, Iss.2, 2009-04, pp. : 111-127

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