Managing for Fine-Scale Differences in Inoculum Load: Seeding Patterns to Minimize Wheat Yield Loss to Take-all

Author： Garrett K. A.   Kabbage M.   Bockus W. W.  

Publisher： Springer Publishing Company

ISSN： 1385-2256

Source： Precision Agriculture, Vol.5, Iss.3, 2004-06, pp. : 291-301

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