Microstructural, chemical bonding, stress development and charge storage characteristics of Ge nanocrystals embedded in hafnium oxide

Author： Das S.   Singha R.   Manna S.   Gangopadhyay S.   Dhar A.   Ray S.  

Publisher： Springer Publishing Company

ISSN： 1388-0764

Source： Journal of Nanoparticle Research, Vol.13, Iss.2, 2011-02, pp. : 587-595

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