Growth of InGaAs-capped InAs quantum dots characterized by Atomic Force Microscope and Scanning Electron Microscope

Author： Chen Shen-de   Tsai Chiou-yun   Lee Si-chen  

Publisher： Springer Publishing Company

ISSN： 1388-0764

Source： Journal of Nanoparticle Research, Vol.6, Iss.4, 2004-08, pp. : 407-410

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