Focused ion beam milling: A practical method for preparing cast Al-Si alloy samples for transmission electron microscopy

Author: Shankar S.   Riddle Y.   Makhlouf M.  

Publisher: Springer Publishing Company

ISSN: 1543-1940

Source: Metallurgical and Materials Transactions A, Vol.34, Iss.3, 2003-03, pp. : 705-707

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract