Evaluation of Average Domain Size and Microstrain in a Silicide Film by the Williamson–Hall Method

Author: Pelleg Joshua   Elish E.   Mogilyanski D.  

Publisher: Springer Publishing Company

ISSN: 1543-1940

Source: Metallurgical and Materials Transactions A, Vol.36, Iss.11, 2005-11, pp. : 3187-3194

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Abstract