Mapping Residual Stress Distributions at the Micron Scale in Amorphous Materials

Author： Winiarski Bartlomiej   Langford Richard   Tian Jiawan   Yokoyama Yoshihiko   Liaw Peter   Withers Philip  

Publisher： Springer Publishing Company

ISSN： 1543-1940

Source： Metallurgical and Materials Transactions A, Vol.41, Iss.7, 2010-07, pp. : 1743-1751

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