Numerical simulation and comparison of electrical characteristics between uniaxial strained bulk and SOI FinFETs

Author: Li Yiming  

Publisher: Springer Publishing Company

ISSN: 1569-8025

Source: Journal of Computational Electronics, Vol.5, Iss.4, 2006-12, pp. : 371-376

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract