Author: Rotteveel Mark Phaf R. Hans
Publisher: Routledge Ltd
ISSN: 1464-0600
Source: Cognition and Emotion, Vol.21, Iss.6, 2007-09, pp. : 1323-1346
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
The mere exposure effect and recognition memory
By Wang Man-Ying Chang Hsio-Chuan
Cognition and Emotion, Vol. 18, Iss. 8, 2004-01 ,pp. :
Behavioral and Brain Sciences, Vol. 7, Iss. 1, 1984-03 ,pp. :