Author: Schwartz Guy Ben-Dor Eyal Eshel Gil
Publisher: Society for Applied Spectroscopy
ISSN: 0003-7028
Source: Applied Spectroscopy, Vol.67, Iss.11, 2013-11, pp. : 1323-1331
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Vågberg Lena De Potocki Paul Stenius Per
Applied Spectroscopy, Vol. 43, Iss. 7, 1989-09 ,pp. :
By Markopoulou C. K. Koundourellis J. E. Orkoula M. G. Kontoyannis C. G.
Applied Spectroscopy, Vol. 62, Iss. 2, 2008-02 ,pp. :
Internal Reflectance Spectroscopy II: Quantitative Analysis Aspects
By Wilks P. A.
Applied Spectroscopy, Vol. 23, Iss. 1, 1969-01 ,pp. :