Temperature Dependence of the Critical Size of Ferroelectric Thin Films

Author： Wang X. S.   Wang C. L.   Zhong W. L.   Xue X. Y.  

Publisher： Taylor & Francis Ltd

ISSN： 0015-0193

Source： Ferroelectrics, Vol.282, Iss.1, 2003-01, pp. : 49-56

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