Ferroelectric Thin Film Microwave Examination

Author: Kazmirenko V.   Poplavko Y.   Pereverzeva L.   Prokopenko Y.   Kim Beomjin   Jeong Minki   Baik Sunggi  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.286, Iss.1, 2003-06, pp. : 353-356

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Abstract