Author： Puustinen J. Lappalainen J. Hiltunen J. Lantto V. Jantunen H.
Publisher： Taylor & Francis Ltd
ISSN： 0015-0193
Source： Ferroelectrics, Vol.405, Iss.1, 2010-01, pp. : 227-235
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Abstract
Crystal structure and dielectric properties of nanocrystalline Pb(ZrxTi1-x)O3 films were studied. Intensity of Raman mode E(1LO) was increased and peak around ∼580 cm-1 became symmetric and strong (110) crystal plane reflection was observed as the thickness of the films increased from 150 nm to 500 nm. Curie-temperature was found to decrease from ∼370°C to ∼345°C as the orientation changed from tetragonal to trigonal. Dielectric constant was found to be maximized and loss angle minimized for single phase oriented films, while phase co-existence was found to increase loss angle values, and bimodal dielectric maxima were found.
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