Influence of Epitaxial Growth Orientation on Residual Strain and Dielectric Properties of (Ba0.3Sr0.7)TiO3 Films Grown on In-Plane Compressive Substrates

Author: Yamada T.   Kamo T.   Su D.   Iijima T.   Funakubo H.  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.405, Iss.1, 2010-01, pp. : 262-267

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract