Author: Tsai J. K. Wu T. L. Chao S. M. Lam K. T. Meen T. H. Huang C. J. Chen W. R.
Publisher: Taylor & Francis Ltd
ISSN: 0015-0193
Source: Ferroelectrics, Vol.421, Iss.1, 2011-01, pp. : 43-49
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Abstract