Microstructure and Dielectric Properties of Bismuth Copper Tantalate as Internal Barrier Layer Capacitor Ceramic

Author: Szwagierczak D.   Kulawik J.  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.446, Iss.1, 2013-01, pp. : 78-90

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Abstract