Author: Lawrence Earl Wiel Scott Vander Bent Russell
Publisher: Taylor & Francis Ltd
ISSN: 0040-1706
Source: Technometrics, Vol.55, Iss.4, 2013-11, pp. : 426-435
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Xu Bin Guan Xiqiang Zhou Hao Zhang Jianwu
Insight - Non-Destructive Testing and Condition Monitoring, Vol. 55, Iss. 11, 2013-11 ,pp. :
Statistical Process Control Using a Dynamic Sampling Scheme
Technometrics, Vol. 56, Iss. 3, 2014-07 ,pp. :