Author： Luko Stephen N.
Publisher： Taylor & Francis Ltd
ISSN： 0898-2112
Source： Quality Engineering, Vol.25, Iss.4, 2013-10, pp. : 451-454
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Quality Engineering, Vol. 25, Iss. 3, 2013-07 ,pp. :
Access to resources
Recommend
Recent Patents on Industrial Risk Management
Recent Patents on Computer Science, Vol. 8, Iss. 2, 2015-01 ,pp. :
Principles for the design of modern interferometers
By Vlasov N.
Measurement Techniques, Vol. 53, Iss. 3, 2010-07 ,pp. :
The methodological principles of metrology
By Kolosnitsyn N. Kononogov S.
Measurement Techniques, Vol. 49, Iss. 8, 2006-08 ,pp. :