Future Direction for a Diffusion Barrier in Future High-Density Volatile and Nonvolatile Memory Devices

Author： Yoon Dong-Soo   Roh Jae   Baik Hong   Lee Sung-Man  

Publisher： Taylor & Francis Ltd

ISSN： 1040-8436

Source： Critical Reviews in Solid State and Material Sciences, Vol.27, Iss.3-4, 2002-07, pp. : 143-226

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