Atomic and Electronic Structures of Traps in Silicon Oxide and Silicon Oxynitride

Author: Gritsenko Vladimir   Wong Hei  

Publisher: Taylor & Francis Ltd

ISSN: 1040-8436

Source: Critical Reviews in Solid State and Material Sciences, Vol.36, Iss.3, 2011-07, pp. : 129-147

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract