Perspectives for the ECLISSE method with third generation ECRIS

Author: Gammino S.   Torrisi L.   Consoli F.   Margarone D.   Celona L.   Ciavola G.  

Publisher: Taylor & Francis Ltd

ISSN: 1042-0150

Source: Radiation Effects and Defects in Solids, Vol.163, Iss.4-6, 2008-04, pp. : 277-286

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Abstract