Author: Hua Wei Yao Shu-De Theodore N. David Martin Michael Aitkaliyeva Assel Shao Lin
Publisher: Taylor & Francis Ltd
ISSN: 1042-0150
Source: Radiation Effects and Defects in Solids, Vol.165, Iss.5, 2010-05, pp. : 388-395
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Bubble Nucleation During Oxidation of SiC
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, Vol. 98, Iss. 8, 2015-08 ,pp. :
Ion-Induced Anomalous Charge Collection Mechanisms in SiC Schottky Barrier Diodes
Materials Science Forum, Vol. 2015, Iss. 821, 2015-07 ,pp. :