Author： Wolff M. Radu F. Petoukhov A. Humblot H. Jullien D. Andersen K. H. Zabel H.
Publisher： Taylor & Francis Ltd
ISSN： 1044-8632
Source： Neutron News, Vol.17, Iss.2, 2006-07, pp. : 26-29
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Abstract
Currently magnetic multilayers, thin films, and, in particular, patterned magnetic media attract increasing interest [1]. The reason for this is not only the fact that they offer an opportunity for a deeper understanding of magnetism on all length scales, but also their importance for the design of magnetic data storage systems with increasing package density. Starting from the early 1980s, neutron reflectivity has been known for probing the magnetic and structural scattering length density profile in the direction of the surface normal. To gain additional information on the roughness, magnetic domain size and/or lateral patterning, a detailed evaluation of the diffuse scattering is essential.
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