RAMAN CHARACTERISATION OF NANOCRYSTALLINE SILICON FILMS

Author: CHIKALOVA-LUZINA O.   MATSUMOTO T.   KONDO M.   VYATKIN V.  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.103, Iss.1, 2008-01, pp. : 25-31

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract