Spectroscopic Ellipsometry Characterization of Optical Properties for Ti-Doped SiO₂ Mesoporous Films

Author： Yue Chunxiao Sun Zuyao Yao Lanfang Jiang Kaiming

ISSN： 1058-4587

Source： Integrated Ferroelectrics, Vol.127, Iss.1, 2011-01, pp. : 15-20

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