Author: Seong Nak-Jin Shin Woong-Chul Choi Eun-Suck Ryoo Sung-Nam Yoon Soon-Gil
Publisher: Taylor & Francis Ltd
ISSN: 1058-4587
Source: Integrated Ferroelectrics, Vol.46, Iss.1, 2002-01, pp. : 205-214
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Abstract
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