On-Wafer Measurements of Tuneability in Ba0.5Sr0.5TiO3 Thin Films

Author: SUHERMAN P.   JACKSON T.   KOUTSONAS Y.   CHAKALOV R.   LANCASTER M.  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.61, Iss.1, 2004-01, pp. : 133-137

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