CONTROLLABLE CHARGE DENSITY IN THE Si NANOCRYSTALS NONVOLATILE MEMORY

Author: SHEN J.   LU T.   ALEXE M.   KIDUN O.   ZACHARIAS M.  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.78, Iss.1, 2006-11, pp. : 271-279

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract