Investigation on Resistive Memory Switching Mechanism of NiO

Author: Kim D. C.   Seo S.   Suh D. -S.   Jung R.   Lee C. W.   Shin J. K.   Yoo I. K.   Baek I. G.   Kim H. J.   Yim E. K.   Lee C. W.   Park S. O.   Kim H. S.   Chung U-In   Moon J. T.   Ryu B. I.   Kim J. -S.   Park B. H.  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.93, Iss.1, 2007-09, pp. : 90-97

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