Molecular layering and local order in thin films of 1-alkyl-3-methylimidazolium ionic liquids using X-ray reflectivity

Author： Carmichael Adrian J.   Hardacre Christopher   Holbrey John D.   Nieuwenhuyzen Mark   Seddon Kenneth R.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3028

Source： Molecular Physics, Vol.99, Iss.10, 2001-05, pp. : 795-800

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Wall thickness and core radius determination insurfactant templated silica thin films using GISAXSand X-ray reflectivity

By  

EPL (EUROPHYSICS LETTERS), Vol. 63, Iss. 6, 2003-09 ,pp. : 833-839

Edp Sciences

Access to resources Recommend Favorite

Characterization of thin films and multilayers by specular X-ray reflectivity

By  

Journal de Physique III, Vol. 4, Iss. 9, 1994-09 ,pp. : 1503-1511

Edp Sciences

Access to resources Recommend Favorite

X-ray reflectivity measurements on Cd-arachidat films

By  

Le Journal de Physique IV, Vol. 03, Iss. C8, 1993-12 ,pp. : C8-189-C8-192

Edp Sciences

Access to resources Recommend Favorite

Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films

By  

Journal of Physics: Conference Series , Vol. 211, Iss. 1, 2010-02 ,pp. : 94-99

IOP Publishing

Access to resources Recommend Favorite

Glass transition of ultrathin films probed by X-ray reflectivity

By  

Le Journal de Physique IV, Vol. 10, Iss. PR7, 2000-05 ,pp. : Pr7-247-Pr7-250

Edp Sciences

Access to resources Recommend Favorite