Author: Hibbins A. P. Sambles J. R. Lawrence C. R.
Publisher: Taylor & Francis Ltd
ISSN: 1362-3044
Source: Journal of Modern Optics, Vol.45, Iss.5, 1998-05, pp. : 1019-1028
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Influence of roughness profile on reflectivity and angle-dependent X-ray fluorescence
Journal de Physique III, Vol. 4, Iss. 9, 1994-09 ,pp. :
Measuring the dependence of reflectivity on the incidence angle: a technical note
By Vieira L G
European Journal of Physics, Vol. 35, Iss. 5, 2014-09 ,pp. :
Metallic Strip Gratings in the Sub-Subwavelength Regime
By Savin Adriana Steigmann Rozina Bruma Alina
Sensors, Vol. 14, Iss. 7, 2014-07 ,pp. :