Enhancement of the em field inside a local probe microscope

Author: Reutskiy S.   Pittalis S.   Tirozzi B.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3044

Source: Journal of Modern Optics, Vol.47, Iss.1, 2000-01, pp. : 25-32

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract