Enhancement of the em field inside a local probe microscope

Author: Reutskiy S.   Pittalis S.   Tirozzi B.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3044

Source: Journal of Modern Optics, Vol.47, Iss.1, 2000-01, pp. : 25-32

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Abstract

We deal with the two-dimensional scattering problem of an incoming monochromatic p-polarized wave inside a tip-surface junction of a local probe microscope. We find enhancement of the field with lateral size less than 40nm and amaximum of the order of 10 4. This result is very encouraging for experimental work on the aperture less-SNOM (perturbation mode). The solution is obtained by means of the method of discrete sources.