Optical characterization of double layers containing epitaxial ZnSe and ZnTe films

Author： Šiler Martin   Ohlídal Ivan   Franta Daniel   Montaigne Ramil Alberto   Bonanni Alberta   Stifter David   Sitter Helmut  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3044

Source： Journal of Modern Optics, Vol.52, Iss.4, 2005-03, pp. : 583-602

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