Analysis of coherent symmetrical illumination for electronic speckle pattern shearing interferometry

Author: Román Juan F.   Moreno Vicente   Petzing Jon N.   Tyrer John R.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3044

Source: Journal of Modern Optics, Vol.52, Iss.6, 2005-04, pp. : 797-812

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

In an effort to find a non-contact technique capable of providing measurements of in-plane strain, a speckle shearing interferometer was designed using symmetrical coherent illumination. This paper presents an analysis of the sensitivity to displacement and strain of this interferometer, together with an analysis of the phase-stepping of the resultant fringe patterns. New notation is introduced alongside this analysis to define the interference components in speckle shearing interferometers using multiple illumination beams. Experimental results show fringe patterns and phase stepping in support of the theoretical analysis.