Unified approach for rough phase measurement without phase unwrapping by changing the sensitivity factor

Author： Huang Y. H.   Liu L.   Chen Y. S.   Li C. L.   Hung Y. Y.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3044

Source： Journal of Modern Optics, Vol.56, Iss.9, 2009-05, pp. : 1070-1077

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