Quantification of critical alignment parameters for a rotationally-shearing interferometer employing exact ray trace

Author: Gutierrez-Herrera Enoch   Strojnik Marija   Paez Gonzalo  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3044

Source: Journal of Modern Optics, Vol.57, Iss.6, 2010-03, pp. : 444-459

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Abstract