Author: Elvidge C. D. Hobson V. R. Baugh K. E. Dietz J. B. Shimabukuro Y. E. Krug T. Novo E. M. L. M. Echavarria F. R.
Publisher: Taylor & Francis Ltd
ISSN: 1366-5901
Source: International Journal of Remote Sensing, Vol.22, Iss.14, 2001-09, pp. : 2661-2673
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Chand T. R. Kiran Badarinath K. V. S. Murthy M. S. R. Rajshekhar G. Elvidge C. D. Tuttle B. T.
International Journal of Remote Sensing, Vol. 28, Iss. 10, 2007-05 ,pp. :
By Prasad V. Krishna Kant Yogesh Gupta P. K. Elvidge C. Badarinath K. V. S.
International Journal of Remote Sensing, Vol. 23, Iss. 14, 2002-07 ,pp. :