Growth profile based crop yield models: a case study of large area wheat yield modelling and its extendibility using atmospheric corrected NOAA AVHRR data

Author: Kalubarme M. H.   Potdar M. B.   Manjunath K. R.   Mahey R. K.   Siddhu S. S.  

Publisher: Taylor & Francis Ltd

ISSN: 1366-5901

Source: International Journal of Remote Sensing, Vol.24, Iss.10, 2003-05, pp. : 2037-2054

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