Analysis of phenological change patterns using 1982-2000 Advanced Very High Resolution Radiometer (AVHRR) data

Author: Tateishi R.   Ebata M.  

Publisher: Taylor & Francis Ltd

ISSN: 1366-5901

Source: International Journal of Remote Sensing, Vol.25, Iss.12, 2004-06, pp. : 2287-2300

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