Factors affecting the grain yield predicting attributes of spectral reflectance indices in durum wheat: growing conditions, genotype variability and date of measurement

Author: Bort J.   Casadesus J.   Nachit M. M.   Araus J. L.  

Publisher: Taylor & Francis Ltd

ISSN: 1366-5901

Source: International Journal of Remote Sensing, Vol.26, Iss.11, 2005-06, pp. : 2337-2358

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